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    Add to your NVDIMM Knowledge – Attend the January 28 Summit

    January 15th, 2014

    Over 150 individuals participated in the BrightTALK Enterprise Storage Summit NVDIMM webcast.  If you are eager for more information on NVDIMM, you will want to attend an upcoming SNIA Event – the Storage Industry Summit on Non–Volatile Memory.

    This Summit will take place at the Sainte Claire Hotel in San Jose, CA on January 28th as part of the SNIA Annual Members’ Symposium, and will offer critical insights into NVM, including NVDIMMs, and the future of computing. This event is complimentary to attend and you can register here.

    The Summit will take place from 8:15 AM to 5:30 PM and speakers currently include:

    • Nigel Alvares, Senior Director of Marketing, Inphi
    • Bob Beauchamp, Distinguished Engineer and Director Hardware Technology and Architecture, EMC
    • Matt Bryson, ABR Investment Strategy, LLC, SVP-Research
    • Jeff Chang, Vice President, Marketing & Business Development, AgigA Tech
    • Tom Coughlin, Founder, Coughlin Associates
    • Mark Geenen, President, TrendFocus
    • Jim Handy, Analyst, Objective Analysis
    • Jay Kidd, CTO, NetApp
    • Eden Kim, CEO, Calypso
    • Tau Leng, VP/GM, Supermicro
    • Jeff Moyer, Principal Software Engineer, Red Hat
    • Wes Mukai, VP of Cloud Computing, System Engineering, SAP
    • Jim Pinkerton, Lead Partner Architect, Microsoft
    • Adrian Proctor, VP Marketing, Viking Technology
    • Andy Rudoff, Senior Software Engineer, Intel
    • Esther Spanjer, Director, Marketing Management, SanDisk
    • Garret Swart, Database Architect, Oracle
    • Nisha Talagala, Lead Architect, Fusion-IO
    • Doug Voigt, Distinguished Technologist in Storage, HP

    Visit http://www.snia.org/nvmsummit for more information and we hope you will join us in San Jose!


    Updated Client Solid State Performance Test Specification Now Available

    June 26th, 2012

    SNIA’s Solid State Storage Initiative has just released a revised Client SSS Performance Test Specification (PTS-Client) which adds a new write saturation test and refines existing tests.

    The Solid State Storage Performance Test Specification (PTS) is a device-level performance test suite for benchmarking and comparing performance among SAS, SATA and PCI Express SSDs

    Revision 1.1 of the PTS-Client updates tests for IOPS, throughput and latency to more accurately reflect the workload conditions under which Client SSDs are used.  The PTS-Client v1.1 also adds a Write Saturation test that measures the initial Fresh-Out-of-Box state of SSDs and their performance evolution as data is randomly written to the device.

    Eden Kim, Chair of SNIA’s SSS Technical Working Group, describes the primary updates to PTS-Client v1.1 as adjustments to preconditioning ranges and test boundaries.   Taken together, these parameters create a repeatable test stimulus that more accurately reflects the workload characteristics of SSDs used in a single user environment The PTS-Client v1.1 also adds an easily understandable description of each test, which helps the user to understand the purpose of the test, the test flow, and guidance on how to interpret the test results.

    Sample test results using the PTS-Client v1.1 have been posted to the SNIA SSSI Understanding PTS Performance webpage.